Title |
Development of Hand-Held Type Sheet Resistance Meter Based on a Dual-Configuration Four-Point Probe Method |
Authors |
강전홍(Kang, Jeon-Hong) ; 유광민(Yu, Kwang-Min) ; 김완섭(Kim, Wan-Seop) |
Keywords |
Four-Point Probe ; Single- & Dual-Configuration ; Sheet Resistance ; Accuracy ; Uncertainty |
Abstract |
Portable sheet resistance-measuring instrument using the dual-configuration Four-Point Probe method is developed for the purpose of precisely measuring the sheet resistance of conducting thin films. While single-configuration Four-Point Probe method has disadvantages of applying sample size, shape and thickness corrections for a probe spacing, the developed instrument has advantages of no such corrections, little edge effects and measuring simply and accurately the sheet resistance between 0.2\Omega/sq and 2k\Omega/sq. |